Witness Sample, Transmission, IR

Esco Optics witness samples used for transmission are precision polished on both sides to a scratch dig of 60-40. Flatness of each side is < 1 wave @ 633nm at 80% CA. Parallelism < 1 arc min. Witness sample diameter is 25.40mm and the thickness is 1.50mm. All materials are fabricated from single crystals. Edges are safety beveled.  The refractive index values listed are representative of nd at 587nm.  Diameter 25.40 mm +\-0.10 Thickness  1.50 mm +/-0.25 Flatness < 1.0 wave @ 633nm  Surface Quality 60-40 scratch-dig Edges Fine ground and beveled Materials CaF2, Sapphire, ZnSe, Germanium, Silicon