EMC-Test-Device for IO-Link

The device generates an 8-bit random number which is read out by the master. During the test, the master should return this random number to the device in the next IO-Link cycle. The device checks whether it receives the correct random number and then, increments an internal error counter if not. The error counter is also incremented if a checksum error or a parity error is detected on the device side. The error count can be read out by the master via an IO-Link parameter after the test. In addition, the error counter value is also displayed by a 7-segment indicator. When an error is detected the device generates a trigger signal at an optical output. A trigger box that converts the optical signal into a trigger pulse can be connected to the device. The trigger pulse supports developers in identifying possible issues on the master side. The device can be configured by DIP-Switches to operate in one of 3 COM-speeds.