Panthera TEC MAT

The Panthera TEC offers high value for the inspection of semiconductors and and various other materials, especially in industrial quality control and technical education. Brightfield, Darkfield and Cross-Polarization contrast are combined with a new, unique-to-Motic segmental illumination that all contribute to the versatility of this model. This concept allows an oblique incident illumination, perfect for the detection of scratches or other defects on flat and reflecting surfaces without a need to move the sample. BD  models  feature LD Plan BD objectives  with  a  superb  imaging performance, mounted on a 5-fold nosepiece. Features Panthera TEC MAT - Powerful Solutions for Material Sciences The Panthera TEC series of Industrial microscopes is the missing link in the Panthera family: Incident light microscopes for material sciences, ready to handle semiconductors, LCD panels and wafers with a clever Brightfield/Darkfield illumination concept. To extend the application fields for compo