MDPlinescan

Flexible OEM unit for lifetime measurements at a variety of different samples ranging from mono- to multicrystalline silicon bricks, from as-grown wafers to process control of wafers with different layers or metallization. Standard software interface for easy connection to many handling or automatization systems.   Inline line scanner or single spot measurement MDPlinescan is designed as an easy to integrate OEM unit for integration into a variety of automated inspection lines. Key measurements are carrier lifetime scans on the fly. Samples are usually carried by a conveyor belt or robot system underneath the measurement head. Application examples range from brick to wafer inspection with measurement speed of less than one second per wafer. Incoming material quality investigation in cell production lines are frequent application cases as well as process quality check after passivation and diffusion, within many other specialized application possibilities. Easy to integrate only etherne