MDPmap

Mono- and Multi-crystalline wafer lifetime measurement device for sophisticated material research & development Features of MDPmap Sensitivity: highest sensitivity for visualization of so far invisible defects and investigations of epitaxial layersMeasurement speed: < 5 minutes for a 6-inch Si wafer, 1 mm resolutionRange of lifetimes: 20 ns to several msContamination determination: metal (Fe) contaminations originated in crucibles and equipmentMeasurement capability: from as-cut wafers to fully processed samplesFlexibility: fixed measurement head allows coupling of external lasers with triggerReliability: modular and compact bench top instrument for higher reliability and uptime > 99%Repeatability: > 99%Resistivity: resistivity mapping without frequent calibration   Flexible mapping tool for R&D or production monitoring MDPmap is designed as a compact bench top contactless electrical characterization tool for offline production control or R&D, measuring parameters