MDPpro

Mono- and Multi-crystalline wafer and brick lifetime measurement device for routine quality control, sophisticated material research and development Si | compound semiconductors | oxides | wide bandgap materials | perovskites | epitaxial layers [CdTe | InP | ZnS | SiC | GaAs | GaN | Ge]   Contactless and destruction free lifetime imaging (μPCD/MDP (QSS)), photoconductivity, resistivity and p/n check according to semi standard SEMI PV9-1110 Wafer cutting, Furnace monitoring, Material optimization and more   Routine Lifetime Measurement, Quality Control & Inspection Best throughput: >240 bricks/day or >720 wafers/dayMeasurement speed: <4 minutes for a 156 x 156 x 400 mm standard brickYield improvement: 1 mm cutting criteria for a 156 x 156 x 400 mm standard brickQuality control: designed for quality monitoring of processes and materials like mono or multi-crystalline siliconContamination determination: metal (Fe) contaminations originated in crucibles and equipmentRel