MDPpro 850+
For production and quality control of monocrystalline Si ingots, bricks and wafers. Si for HJT, HIT, TOPcon, bifacial PERC, PERC+ solar cells, Perovskites and more. Features Range of lifetimes20 ns to 100 ms (for samples > 0.3 Ohm cm) SEMI standardPV9-1110 Measurement speed< 30 sec for linescan< 5 min for complete mapping Simultaneous measurement oflifetime μPCD/MDP (QSS) and resistivity Automatic geometric recognitionG12, M10 bricks and wafers Slip Lines in CZ-SI ingot Lifetime measurement of a quasi-mono Si ingot with a lot defects Applications Lifetime & Resistivity Mapping Crystal Growth Monitoring (i. e. Slip lines) Contamination Monitoring Oxygen Striations/OSF Ring Iron Mapping for p-doped Si Light Beam Induced Current (LBIC) Sheet Resistance for Emitter Layer and more... MDPstudio – Operating & Evalution Software User-friendly and advanced operating software with: Export and import functions User structure with operator Over