MDPspot

Low cost tabletop single spot measurements on wafers or bricks.   Tabletop single spot measurements Low-cost tabletop lifetime measurement system for characterization of a variety of different silicon samples at different preparation stages, without built-in automatization. Optional hand operated z-axis for thicker samples up to 156 mm bricks. Standard software for result visualization. MDPspot wIncludes an additional resistivity measurement option. Resistivity measurements for silicon only, either for wafers without height adjustment possibility, or for bricks. One of these two options has to be predefined.       Facts contactless destruction free electrical semiconductor characterization μ-PCD measurement option included advanced sensitivity for visualization of so far invisible defects and investigations of epitaxial layers integration of up to four lasers for a wide range of injection levels access to primary data of single transients as well as maps for