PV09400 - SEMI PV94 - Guide for Identifying Cell Defects In Crystalline Silicon Photovoltaic (PV) Modules By Electroluminescence (EL) Imaging

At several points in their manufacturing and installation process photovoltaic (PV) modules need to be tested regarding their performance and potential defects. Such tests may be necessary to be performed during the life cycle of a module. Testing modules or individual cells of them by electroluminescence (EL) imaging is a well-known method for detecting cell defects. The quality of the images obtained by EL imaging depends critically on the appropriate application of this method. Therefore this Guide provides users directions how to appropriately apply EL imaging of crystalline silicon PV modules. It provides also guidance for the inspection of crystalline silicon PV modules regarding cell defects using EL imaging as well as for classifying the defects. This Guide provides guidance for the inspection of crystalline silicon PV modules regarding cell defects using EL imaging. This Guide also classifies the most common cell defects. It is suitable for identifying cell defects in crystalline silicon PV modules indoor.Referenced SEMI Standards SEMI E89 — Guide for Measurement System Analysis (MSA)