Improved Linear-Light-Source Material Reflectance Scanning

Improved Linear-Light-Source Material Reflectance Scanning

$9.99
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** Presentation release is pending speaker(s) authorization. ** Speaker(s): Jan Meseth RTT AG Shawn Hempel RTT AG Andrea Weidlich RTT AG Lynn Fyffe RTT AG Graham Fyffe RTT AG Craig Miller RTT AG Paul Carroll RTT AG Paul Debevec USC Institute for Creative Technologies Track:Material: The Gathering

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